Scanning Electron Microscope

Unified Engineering, Inc. has acquired a variable pressure scanning electron microscope (SEM) with an energy dispersive spectrometer. The instrument is a Hitachi S-3000N SEM with an EDAX Phoenix EDS X-ray microanalysis system. We are one of the few consulting labs in the US with this latest SEM/EDS technology. Our gallery of sample images will give you an idea of the type of work that can be done with this equipment.

The Hitachi S-3000N can be used to analyze materials at voltages between 1-30 kV and at pressures ranging from <1 Pa to 270 Pa. Variable pressure mode allows microscopy of non-conductive samples such as textiles, paint, plastic, polymer, glass, mineral, corrosion product etc. and also wet or oily samples with no requirement for an application of a conductive coating. Therefore, the analysis is completely non-destructive with no alteration of the surface of interest.

Both secondary electron images (SE) and backscattered electron images (BSE) are routinely obtained. In backscattered mode, images can be viewed in compositional, topographical, and 3D mode. This allows one to select the best image to display the features of interest.

Our instrument is equipped with an infrared camera so that sample orientation can be viewed inside the chamber during the analysis. This facilitates movement and tilt adjustment of the sample to maximize the image and x-ray signal from the area of interest.

An advanced digital image acquisition and management system allows Unified the flexibility to provide it's clients with options for data presentation including contact sheets of images with or without acquisition data, image prints up to 11 X 17 inches, a CD containing images, or electronic transfer of data.

If elemental analysis capability is required, our EDAX Phoenix X-ray microanalysis system is equipped with a light element detector capable of qualitative and quantitative EDS analysis down to boron. A variety of imaging tools provide maximum flexibility in materials analysis. The imaging tools include:

Element mapping, with light element sensitivity, displays elemental distributions across the sample surface. The images can be simultaneously displayed in a "gallery" for easy comparison.

High resolution X-ray mapping with a zoom function to examine features in closer detail without sacrificing resolution. EDS data can be acquired at predetermined intervals and then correlated to specific features on the image.

EDS quantitative mapping software permits an accurate display of elemental distribution without concern for spectral peak overlap. The maps accurately depict the weight percents within the elemental distribution.

Line scans can provide quantitative data across a line profile of the sample. Many options for data image and data display are available.

Area scans that can be varied in size or a spot analysis can be performed to obtain the elemental composition at a specified location. In addition, that locations can be referenced directly on the SEM image.