Lori A. Streit, Ph.D.Chemical and Environmental Scienceemail | PDF version of CV | vCard Dr. Streit is a scientist with education and experience in the areas of surface analysis, microanalysis, materials characterization, chemistry, chemical analysis, materials analysis, material flammability, environmental science, and chemical safety and health. She has experience in the analysis and characterization of many substances, some of which are chemicals, metals, alloys, semiconductors, plastic, rubber, glass, ceramics, polymers, paper, textiles, minerals, composites, soot, soil, water, and air. Employment
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Publications"Quantitative analysis using sputtered neutrals in a secondary ion microanalyzer," P. Williams and L.A. Streit, Nucl. Instrum. Methods B15 (1986) 159-164. "Effect of microstructure on the arsenic profile in implanted silicon," W.A. Coughlan, M.H. Rhee, J.M. Williams, L.A. Streit, and P. Williams, Nucl. Instrum. Methods B16 (1986) 171-176. "Quantitative SIMS microanalysis of trace elements in geological samples using in situ ion-implanted standards," L.A. Streit, R.L. Hervig, and P. Williams, M.A.S. 22nd National Meeting, Albuquerque, 1986; M.A.S. Conf. Proc. (1986) 91-94. "Quantitative analysis of chemical vapor deposited refractory metal silicides," L.A. Streit and P. Williams, A.V.S. 33rd National Meeting, Baltimore, 1986; J. Vac. Sci. Technol. A5(4) (1987) 1979-1983. "Limits of sensitivity in secondary ion mass spectrometry," P. Williams, L.A. Streit, and R.T. Lareau, J. Mass Spec. and Ion Proc. (1987). "A hollow cathode ion source for SIMS / in situ ion implantation of metals," L.A. Streit and P. Williams, SIMS VI International Conference, Paris, 1987; SIMS VI (1988) 201-204. Development of quantitative analytical methods for secondary ion mass spectrometry, L.A. Streit, thesis, 1987. "SIMS / in situ ion implantation of metals and semiconductors generated by a hollow cathode ion source," L.A. Streit and P. Williams, Anal. Chem. 1988. "XPS / AES study of contact surface contamination," L.A. Streit and S.L. Maher, Applied Surface Science Meeting, Denver, 1988. "Factors affecting trace determination of hydrogen by secondary ion mass spectrometry," L.A. Streit and C. Bowers, SIMS VII, Monterey, 1989. "SIMS image analysis of light element distributions in carbon composite material," L.A. Streit, SIMSVII, Monterey, 1989. "Investigations of a Black Soot Phenomenon in Florida Residential Structures Associated with New Installation of Central Heating and Air Conditioning Systems," J.D. Krause, K.K. Al-Ahmady, and L.A. Streit, Proceedings of the Engineering Conference on Air and Waste Management, North Carolina, July 1997. "Enhanced Deposition, Acoustic Agglomeration, and Chladni Figures in Smoke Detectors," C. Worrell, G. Gaines, R. Roby, L. Streit, and J.L. Torero, Fire Technology, 37, 343-362, 2001. "Effect of Smoke Source and Horn Configuration on Enhanced Deposition, Acoustic Agglomeration, and Chladni Figures in Smoke Detectors," C.L. Worrell, J.A. Lynch, G. Jomas, R.J. Roby, L. Streit, and J.L. Torero, Fire Technology, 39, 309-346, 2003. |